Series of ReRAM characterization modules compatible with Keithley Semiconductor Characterization Systemsinstruments
This repository includes a number of ReRAM characterization and stress testing scripts compatible with Keithley semiconductor characterization system. Implementaions were co-developed in favor of Electronic Nanomaterials and Devices Group of National Technical University of Athens (NTUA) by:
chris_man_memstress.c is a module designed to implement ISPP(Incremental Step Pulse Programming) and ECC(Error Checking/Correction) algorithm in Flash memories. More info about this algorithm can be found here
chris_man_reramEndurance.c is a module variation in order to achieve pulse test automation. This module enables the user to make repeated pulse tests in Flash Memories.
chris_man_reramSweep.c is a module designed to implement multiple pulse tests with varying voltage input. The user decides the initial voltage input, the voltage increment per test repetition, as well as the total number of pulses given. This module is used for calculating resistances in Flash Memories under various voltages.
chris_man_retention.c is a module designed to execute pulse test for an extended amount of time. Pulse tests are being executed untill given time is elasped.
This module is used for monitoring the resistance of a Flash Memory as time elaspes. Note that this module is designed to be executed for long time periods (hours or even days).
Keithley 4200-Semiconductor Characterization System.
These modules have been tested succesfully on this system, however they can be ported to other systems.
NVM Keithley library
Due to copyright issues, chris_man_memstress.c should be installed with the following steps:
In order to use the other modules, the same approach is recommended. KULT_body code consists of the main block code ,omitting however the declaration of main function as well its parameters.