A Statistical Machine Learning Approach to Yield C
Comput Econ (2015) 45:635–645 DOI 10.1007/s10614-
Electronic copy available at: http://ssrn.com/abst
Deep Learning Adaptive Computation and Machine Le
root@iMX6-ubuntu-desktop:~/data/cnn/ncnn/benchmark
Deep Learning Ian Goodfellow Yoshua Bengio Aaro